Ceng Chen, Gabriella Nagy, Amy V. Walker, Karl Maurer, Andy McShea, and Kevin D. Moeller
J. Am. Chem. Soc., 2006, 128 (50), 16020–16021
Time-of-flight secondary ion mass spectrometry (TOF SIMS) has been used in conjunction with a mass spectrometry cleavable linker to determine the percent conversion of reactions that were conducted site-selectively on an addressable microelectrode array. When combined with fluorescence techniques for analysis of the reactions, the TOF SIMS experiment provides a means for optimization of both reaction confinement and reaction efficiency on the microelectrode arrays.