The Cameca IMS 7f-GEO: SIMS for the Geosciences Lab

What is a Secondary Ion Mass Spectrometer (SIMS) and what can it do?

The Cameca IMS-7f SIMS is considered one of the most sensitive surface analysis instruments available, providing materials characterization and compositional analysis with detection limits as low as 1 part per billion and sub-micron patial resolution down. The standard instrument can be configured for bulk analysis, depth profiling and ion imaging (elemental mapping). The 7f-GEO instrument shown here has been additionally modified with hardware and software to facilitate high-precision stable isotope ratio analyses that are particularly germane to our research goals here at Washington University.

There are currently only two other 7f-Geo SIMS machines in the world: Cal Tech and Virginia Tech.


Funded by the National Science Foundation, PI David Fike, Earth and Planetary Sciences. Manufactured by CAMECA in Paris, France